Method for measuring a delay time of a digital circuit and...

Details Method for measuring a delay time of a digital circuit and... Method for measuring a delay time of a digital circuit and...

2007-08-21

2007-08-21

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S080000, C702S089000, C713S401000

Reexamination Certificate

active

11215057

ABSTRACT:
In a method and device measuring a delay time of a section of a digital circuit, an output signal of the section is saved in different memory locations with a clock and earlier by a time interval with respect to the clock, different durations being assigned to the time interval. The delay time is determined as a function of the greatest of the different durations during which a test proceeds in a positive manner. The test proceeds in a positive manner if the value saved with the clock corresponds with the value saved so as to be earlier by the corresponding time interval.

REFERENCES:
patent: 3836756 (1974-09-01), Yammoto et al.
patent: 4345241 (1982-08-01), Takeuchi et al.
patent: 5517155 (1996-05-01), Yamauchi et al.
patent: 5942902 (1999-08-01), Okayasu
patent: 6184753 (2001-02-01), Ishimi et al.
patent: 6658581 (2003-12-01), Takahashi et al.
patent: 6715118 (2004-03-01), Kaiser
patent: 6956422 (2005-10-01), Reilly et al.
patent: 6993672 (2006-01-01), Takahashi et al.
patent: 196 52 890 (1997-07-01), None
patent: 198 45 409 (2000-04-01), None
patent: 100 06 236 (2001-09-01), None
patent: 0 994 361 (2000-04-01), None

Affiliated with

Also associated with

Rating

Method for measuring a delay time of a digital circuit and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for measuring a delay time of a digital circuit and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for measuring a delay time of a digital circuit and... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3847373