Geometrical instruments – Gauge – Movable contact probe – per se
Reexamination Certificate
2007-06-12
2007-06-12
Fulton, Christopher W. (Department: 2859)
Geometrical instruments
Gauge
Movable contact probe, per se
C033S558000
Reexamination Certificate
active
11515516
ABSTRACT:
A probe for a coordinate measuring machine has a stationary first part and a second part which can move relative to said first part. The second part can be a feeler pin or a feeler pin extension of the probe. A damping member for damping vibrations of the moveable second part has a magnet arrangement for producing a magnetic field, and has a conductor element. The magnet arrangement is designed such that there is a change in direction of the magnetic field along a path of movement of the conductor element.
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Enderle Eckhard
Herb Monika
Carl Zeiss Industrielle Messtechnik GmbH
Fulton Christopher W.
Harness & Dickey & Pierce P.L.C.
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