Method and apparatus for rapid thermal testing

Thermal measuring and testing – Differential thermal analysis – Detail of electrical heating control

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C374S057000, C324S760020, C702S118000

Reexamination Certificate

active

10783166

ABSTRACT:
An apparatus for rapid thermal testing of samples consisting of a single sample chamber in which the samples are preferably arranged circularly around the opening through which a fluid of varying temperature, preferably air, is introduced to provide for rapid, uniform cooling and heating of the samples. The samples are preferably uniformly spaced to allow for uniform air flow. The samples are mounted in slots which are preferably oriented radially outward from the opening. The sample mounts comprise electrical connectors which form a network connected to at least one ohmmeter for measuring the resistance of the samples. The samples preferably comprise test coupons, each with multiple daisy-chained nets of vias or other components to be tested. Also a method for thermal testing of samples consisting of steps to characterize the samples before the test is run. First, the resistance of the samples which correlates to each target temperature is determined, and the time required for the samples to reach that resistance when they are heated or cooled is measured. Then, for reliability testing, the temperature of the samples is cycled between the target temperatures, where the cycle segment durations are given by the times measured in the characterization steps.

REFERENCES:
patent: 4367961 (1983-01-01), Griffin
patent: 4517512 (1985-05-01), Petrich et al.
patent: 4871965 (1989-10-01), Elbert et al.
patent: 5324481 (1994-06-01), Dunn et al.
patent: 5337893 (1994-08-01), Nami et al.
patent: 5392219 (1995-02-01), Birch et al.
patent: 5451885 (1995-09-01), Birch et al.
patent: 5506510 (1996-04-01), Blumenau
patent: 5701667 (1997-12-01), Birch et al.
patent: 5834946 (1998-11-01), Albrow et al.
patent: 5942432 (1999-08-01), Smith et al.
patent: 5986447 (1999-11-01), Hanners et al.
patent: 6040691 (2000-03-01), Hanners et al.
patent: 6304093 (2001-10-01), Hilmoe et al.
patent: 6406918 (2002-06-01), Bannister et al.
patent: 6472156 (2002-10-01), Wittwer et al.
patent: 6787338 (2004-09-01), Wittwer et al.
patent: 7084659 (2006-08-01), Delucco et al.
patent: 2003/0122566 (2003-07-01), Takahashi et al.
patent: 2003/0231693 (2003-12-01), Hutter
patent: 2005/0194989 (2005-09-01), Delucco et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for rapid thermal testing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for rapid thermal testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for rapid thermal testing will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3822905

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.