Process and circuit for protection of test contacts in high...

Details Process and circuit for protection of test contacts in high... Process and circuit for protection of test contacts in high...

2007-11-13

2007-11-13

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

11079303

ABSTRACT:
To limit the current in heavy current testing of semiconductor components with test needles, upstream of each needle a circuit is connected which has low resistance in the range of allowable currents and has high resistance above a given limit current in order to limit the current. The current source which undertakes limitation in the electrical supply lead to the probes is galvanically separated from the voltage supply of the current source itself.

REFERENCES:
patent: 4894605 (1990-01-01), Ringleb et al.
patent: 5070297 (1991-12-01), Kwon et al.
patent: 5497079 (1996-03-01), Yamada et al.
patent: 5600257 (1997-02-01), Leas et al.
patent: 5701666 (1997-12-01), DeHaven et al.
patent: 5781021 (1998-07-01), Ilani
patent: 5838163 (1998-11-01), Rostoker et al.
patent: 5898633 (1999-04-01), Caravella et al.
patent: 6005303 (1999-12-01), Hawkes et al.
patent: 6064219 (2000-05-01), Aigner
patent: 6066979 (2000-05-01), Adams et al.
patent: 6133744 (2000-10-01), Yojima et al.
patent: 6518779 (2003-02-01), Nakata et al.
patent: 6788090 (2004-09-01), Aihara
patent: 6897670 (2005-05-01), Burns
patent: 2003/0234659 (2003-12-01), Zieleman
patent: 1 125 002 (1962-03-01), None
patent: 101 31 386 (2003-02-01), None
patent: 0 838 688 (1998-04-01), None
patent: 2 336 046 (1999-10-01), None

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