Timing generation circuit and semiconductor test device...

Details Timing generation circuit and semiconductor test device... Timing generation circuit and semiconductor test device...

2007-11-13

2007-11-13

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C714S720000

Reexamination Certificate

active

10538595

ABSTRACT:
A timing generation circuit can increase a maximum delay amount without changing the configuration of a timing memory. The timing generation circuit includes: a timing memory (TMM)10containing predetermined timing data; a plurality of down counters20for loading the timing data from the TMM and outputting a pulse signal at the timing indicated by the timing data; an address selection circuit40for specifying one or two TMM addresses by switching and outputting corresponding one or plural timing data; a load data switching circuit50for loading the plural timing data to the plural down counters cascaded and outputting one timing pulse signal; and a timing data selection circuit60for selecting one of the pulse signals. The plural timing data are generated by dividing the timing memory into a plurality of memory regions either in a column or row direction.

REFERENCES:
patent: 4998025 (1991-03-01), Watanabe
patent: 5293080 (1994-03-01), Hiwada et al.
patent: 5406132 (1995-04-01), Housako
patent: 5854798 (1998-12-01), Uehara
patent: 6226230 (2001-05-01), Watanabe
patent: 6903566 (2005-06-01), Sudou et al.
patent: 7164617 (2007-01-01), Honda
patent: 7-26787 (1995-05-01), None
patent: 10-319097 (1998-12-01), None
patent: 2000-305800 (2000-11-01), None
patent: 2001-124835 (2001-05-01), None

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