Electronic device environmental effect prediction

Details Electronic device environmental effect prediction Electronic device environmental effect prediction

2007-05-22

2007-05-22

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Temperature measuring system

C073S075000, C324S760020, C361S689000, C700S276000, C700S278000, C700S299000, C703S014000

Reexamination Certificate

active

10738788

ABSTRACT:
An apparatus in one example comprises one or more control components that regulate one or more thermal test components to adjust one or more emulated operational characteristics for one or more electronic devices. The thermal test components are coupled with one or more rack-mount frames. The thermal test components create the emulated operational characteristics for the one or more electronic devices to generate one or more emulated environmental effects. The one or more control components obtain one or more measurements of one or more of the one or more emulated operational characteristics and the one or more emulated environmental effects. The one or more control components make a prediction of one or more of one or more actual operational characteristics and one or more actual environmental effects of the one or more electronic devices through employment of one or more of the one or more measurements.

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