Method for measuring characteristics of FETs

Details Method for measuring characteristics of FETs Method for measuring characteristics of FETs

2007-06-12

2007-06-12

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11314458

ABSTRACT:
In an FET-characteristic measuring method, a predetermined bias voltage output from an output terminal of a bias tee is applied to the drain of an FET, and a pulse output from a pulse generator is applied to the gate thereof to thereby cause drain current to be generated. The drain current is converted by a load impedance, connected to an AC output terminal of the bias tee, into a voltage pulse, and is measured based on the voltage pulse. The method includes increasing the bias voltage by an amount corresponding to a voltage drop caused by the load impedance and repeating measurement of a value of the voltage pulse a predetermined number of times, and applying extrapolation to the last two values of the voltage-pulse values obtained by the predetermined number of repeated measurements to determine a drain voltage to be applied to the FET.

REFERENCES:
patent: 3965420 (1976-06-01), Bennett
patent: 5838164 (1998-11-01), Chen
patent: 6407573 (2002-06-01), Yamaguchi et al.
“Measurement of I-V Curves of Silicon-on-Insulator (SOI) MOSFET's Without Self-Heating.” K.A. Jenkins et al. IEEE Electron Device Letters, vol. 16, No. 4, Apr. 1995, Abstract only.

Affiliated with

Also associated with

Rating

Method for measuring characteristics of FETs does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for measuring characteristics of FETs, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for measuring characteristics of FETs will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3810186