Method for calibrating a pulsed measurement system

Details Method for calibrating a pulsed measurement system Method for calibrating a pulsed measurement system

2007-04-17

2007-04-17

Hirshfeld, Andrew H. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Calibration

C324S715000, C324S072500

Reexamination Certificate

active

10953625

ABSTRACT:
A method for calibrating a pulsed measurement system, the system having a pulse generator unit, a measurement unit and a probe unit having a first and a second probe tip. The first tip, the pulse generator unit and the measurement unit are all interconnected by respective cables to a power divider network and an additional cable connects the second tip to the measurement unit. The method includes determining the transfer characteristics of the power divider network; measuring the characteristics of the system with the probe tips being open; measuring the characteristics of the system with the probe tips being interconnected; and calculating calibration constants for the system from the measurements and the transfer characteristics. The measurements are performed for pulses having specific characteristics.

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“Characteristics of SOI FET's Under Pulsed Conditions”, Keith A. Jenkins, J. Y.-C. Sun, Senior Member, IEEE, and J. Gautier, IEEE Transactions on Electron Devices, vol. 44, No. 11, Nov. 1997.

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