Methods and apparatus for non-contact testing and diagnosing...

Details Methods and apparatus for non-contact testing and diagnosing... Methods and apparatus for non-contact testing and diagnosing...

2007-05-29

2007-05-29

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S686000

Reexamination Certificate

active

10979590

ABSTRACT:
A method and apparatus for detecting shorts between accessible and inaccessible signal nodes (e.g., integrated circuit pins) of an electrical device (e.g., an integrated circuit), using capacitive lead frame technology is presented. In accordance with the method of the invention, an accessible node under test is stimulated with a known source signal. A capacitive sense plate is capacitively coupled to at least one of the accessible node and inaccessible node of the electrical device, and a measuring device coupled to the capacitive sense plate capacitively senses a signal present on the at least one of the accessible node and inaccessible node of the electrical device. Based on the value of the capacitively sensed signal, a known expected “defect-free” capacitively sensed signal measurement and/or a known expected “shorted” capacitively sensed signal measurement, one can determine whether a short fault exists between the accessible node and inaccessible node of the electrical device.

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