Image analysis – Pattern recognition
Reexamination Certificate
2007-01-09
2007-01-09
Wu, Jingge (Department: 2624)
Image analysis
Pattern recognition
C382S224000, C382S225000, C382S226000, C382S228000
Reexamination Certificate
active
10011272
ABSTRACT:
A pattern recognition method and apparatus decrease the amount of computation for pattern recognition and adapts flexibly to an increase and a change in learning samples. Learning is made beforehand on base vectors in a subspace of each category and a kernel function. Pattern data to be recognized is input, and projection of an input pattern to a nonlinear subspace of each category is decided. Based on the decided projection, a Euclidean distance or an evaluation value related to each category is calculated from the property of the kernel function, and is compared with a threshold value. If a category for which the evaluation value is below the threshold value exists, a category for which the evaluation value is the smallest is output as a recognition result. If there is no category for which the evaluation value is below the threshold value, a teaching signal is input for additional learning.
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Ikeda Hitoshi
Kashimura Hirotsugu
Kato Noriji
Fuji 'Xerox Co., Ltd.
Le Brian
Wu Jingge
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