Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure
Reexamination Certificate
2007-01-09
2007-01-09
Flynn, Nathan J. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Bipolar transistor structure
C257SE27055, C438S133000
Reexamination Certificate
active
10994064
ABSTRACT:
An insulated gate bipolar transistor has a P-type collector region containing a P-type impurity such as boron. A relatively thin N-type buffer region containing arsenic in a relatively high concentration is formed on the collector region via an anti-diffusion region. The anti-diffusion region is provided in such a way that its thickness is the same as or slightly smaller than the distance over which the P-type impurity is diffused from the collector region toward the buffer region in a device fabrication process.
REFERENCES:
patent: 3664896 (1972-05-01), Duncan
patent: 6448588 (2002-09-01), Yun et al.
patent: 05-055583 (1993-03-01), None
Takahashi Ryoji
Torii Katsuyuki
Flynn Nathan J.
Quinto Kevin
Sanken Electric Co. Ltd.
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