Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-05-15
2007-05-15
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
11290077
ABSTRACT:
Methods and systems are provided for characterizing the negative temperature bias instability of a transistor. A bias voltage is maintained at a drain terminal of the transistor during a test period. A stress voltage is maintained at a gate terminal of the transistor during the test period, such that the stress voltage is applied concurrently with the bias voltage. At least one characteristic of the transistor is measured at periodic intervals during the stress period to determine a degradation of the at least one characteristic caused by the stress voltage until a termination event occurs.
REFERENCES:
patent: 3026458 (1962-03-01), Freystedt et al.
patent: 3961208 (1976-06-01), Khanna
patent: 4031456 (1977-06-01), Shimada et al.
patent: 4061959 (1977-12-01), Ahmed
patent: 4574208 (1986-03-01), Lade et al.
patent: 5999011 (1999-12-01), Chu et al.
patent: 6521469 (2003-02-01), La Rosa et al.
patent: 6530064 (2003-03-01), Vasanth et al.
patent: 6653856 (2003-11-01), Liu
patent: 6727710 (2004-04-01), De Jong et al.
patent: 2003/0231028 (2003-12-01), Liu
Chancellor Cathy
Krishnan Anand T.
Krishnan Srikanth
Reddy Vijay
Brady W. James
Keagh Rose Alyssa
Patel Paresh
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
LandOfFree
System and method for accurate negative bias temperature... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for accurate negative bias temperature..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for accurate negative bias temperature... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3796050