Method for measuring thin film transistor array of active...

Details Method for measuring thin film transistor array of active... Method for measuring thin film transistor array of active...

2007-09-18

2007-09-18

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

Reexamination Certificate

active

11264282

ABSTRACT:
A method for measuring the holding properties of a TFT array of an active matrix display panel comprising multiple pixel circuits with holding capacitors, this measuring method being characterized in that the multiple pixel circuits comprise at least a first pixel circuit and a second pixel circuit, and the method comprises a step for charging to the holding capacitor of the first pixel circuit, a step for then charging to the holding capacitor of the second pixel circuit, a step for performing an effect-eliminating procedure due to floating capacity, and a step for measuring the charge of the holding capacitor of the first and second pixel circuits wherein a predetermined holding time after charging has elapsed.

REFERENCES:
patent: 5506599 (1996-04-01), Iwama
patent: 5994916 (1999-11-01), Hayashi
patent: 7012445 (2006-03-01), Itagaki
patent: 2004/0135596 (2004-07-01), Miyagawa et al.

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