Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-09-18
2007-09-18
Mariam, Daniel (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S154000
Reexamination Certificate
active
10615402
ABSTRACT:
A system and method for identifying flaws in a part being inspected includes generating a 3-d representation of the part, the 3-d representation comprising 3-d spatial coordinates corresponding to different locations on the part, and registering the 3-d spatial coordinates with corresponding locations of a part being inspected. An image of the part being inspected is generated, and a flaw in the part being inspected is identified from the generated image. A location of the flaw is correlated to a corresponding 3-d spatial coordinate, and a device is controlled to perform an operation on the part being inspected at the flaw location using information of the corresponding 3-d spatial coordinate.
REFERENCES:
patent: 4755753 (1988-07-01), Chern
patent: 5475613 (1995-12-01), Itoga et al.
patent: 5774568 (1998-06-01), Freneix
patent: 5818718 (1998-10-01), Thomas et al.
patent: 6064759 (2000-05-01), Buckley et al.
patent: 6118540 (2000-09-01), Rashford et al.
patent: 6205239 (2001-03-01), Lin et al.
patent: 6341153 (2002-01-01), Wahawisan et al.
patent: 6466643 (2002-10-01), Bueno et al.
patent: 6539107 (2003-03-01), Michael et al.
patent: 6614872 (2003-09-01), Bueno et al.
patent: 6618465 (2003-09-01), Mohr et al.
patent: 6714831 (2004-03-01), Matthews et al.
patent: 6950548 (2005-09-01), Bachelder et al.
V-D Nguyen et al., “Exhaustive Detection of Manufacturing Flaws as Abnormalities,” 1998 IEEE Comp. Soc. Conf, Jun. 23-25, 1998. pp. 945-952.
European Search Report, EP 04254062, Oct. 29, 2004.
Dinesh Mysore Siddu
Dixon Elizabeth Lokenberg
Lasiuk Brian Walter
McFarland Ronald Cecil
Mohr Gregory Alan
Clarke Penny A.
General Electric Company
Mariam Daniel
Patnode Patrick K.
LandOfFree
System and method for analyzing and identifying flaws in a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for analyzing and identifying flaws in a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for analyzing and identifying flaws in a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3792663