Methods for testing continuity of electrical paths through...

Details Methods for testing continuity of electrical paths through... Methods for testing continuity of electrical paths through...

2007-01-30

2007-01-30

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S537000

Reexamination Certificate

active

11175783

ABSTRACT:
In one embodiment, a method for testing continuity of electrical paths through a circuit assembly includes: 1) mating a test-facilitating circuit package to a connector of the circuit assembly; the circuit package having a plurality of contacts for mating to a plurality of contacts of the connector; the circuit package containing incomplete or no mission circuitry for the circuit assembly, but containing a plurality of passive circuit components coupled in parallel between the package's plurality of contacts and a test sensor port of the circuit package; 2) stimulating one or more nodes of the circuit assembly; 3) measuring an electrical characteristic of the circuit package; and 4) comparing the measured electrical characteristic to at least one threshold to assess continuities of at least two electrical paths through the circuit assembly. Other embodiments are also disclosed.

REFERENCES:
patent: 3806800 (1974-04-01), Bove et al.
patent: 4583042 (1986-04-01), Riemer
patent: 5159526 (1992-10-01), Marek
patent: 5175547 (1992-12-01), Lyon et al.
patent: 5420500 (1995-05-01), Kerschner
patent: 5432460 (1995-07-01), Flecha et al.
patent: 5498964 (1996-03-01), Kerschner et al.
patent: 5557209 (1996-09-01), Crook et al.
patent: 6087842 (2000-07-01), Parker et al.
patent: 6097202 (2000-08-01), Takahashi
patent: 6097203 (2000-08-01), Parker et al.
patent: 6798225 (2004-09-01), Miller
patent: 6960917 (2005-11-01), Parker et al.
patent: 2001/0040464 (2001-11-01), Tanioka et al.
patent: 2005/0077907 (2005-04-01), Parker et al.
patent: 0805356 (1997-01-01), None
patent: 2143954 (1985-02-01), None
patent: 2353399 (1999-08-01), None

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