Cleaning method and polishing apparatus employing such...

Cleaning and liquid contact with solids – Processes – For metallic – siliceous – or calcareous basework – including...

Reexamination Certificate

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C134S002000, C134S006000, C134S026000, C134S028000, C134S029000, C134S034000, C134S036000, C134S041000, C134S902000, C451S060000, C451S285000, C451S287000

Reexamination Certificate

active

10844317

ABSTRACT:
A method is suitable for cleaning substrates, after polishing, that require a high degree of cleanliness, such as semiconductor wafers, glass substrates, or liquid crystal displays. The method includes polishing a substrate using an abrasive liquid containing abrasive particles, and cleaning a polished surface of the substrate by supplying a cleaning liquid having substantially the same pH as the abrasive liquid or similar pH to the abrasive liquid so that a pH of the abrasive liquid attached to the polished surface of the substrate is not rapidly changed.

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