Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-04-03
2007-04-03
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S076110
Reexamination Certificate
active
11001458
ABSTRACT:
Systems and methods are disclosed for identifying recurrent patterns. In one embodiment, a method comprises: estimating a power spectral density of a time series; determining a duration-level associated with a peak in the power spectral density; and aggregating the time series at the duration-level to obtain a recurrent pattern.
REFERENCES:
patent: 5712985 (1998-01-01), Lee et al.
patent: 5852793 (1998-12-01), Board et al.
patent: 6760847 (2004-07-01), Liu et al.
patent: 2006/0041201 (2006-02-01), Behbehani et al.
Hewlett--Packard Development Company, L.P.
Raymond Edward
LandOfFree
Methods and systems for identifying recurrent patterns does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods and systems for identifying recurrent patterns, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods and systems for identifying recurrent patterns will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3778864