Semiconductor device with test circuit disconnected from...

Details Semiconductor device with test circuit disconnected from... Semiconductor device with test circuit disconnected from...

2007-07-24

2007-07-24

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010

Reexamination Certificate

active

10946024

ABSTRACT:
A semiconductor device with a test circuit disconnected from a power supply connection to reduce leakage current, and a method of manufacture thereof. The test circuit may be used to test functional circuits on the semiconductor device, and after the tests are completed, the test circuit is disconnected from the power supply connection. The test circuit is powered by contacting a test pad with a probe that supplies power to the test circuit, in one embodiment. In another embodiment, the test circuit is disconnected from the power supply using a laser to blow a fuse in the path of the power supply connection for the test circuit. Optional features include a bleeder device coupled to the power supply input of the test circuit, and logic circuitry for setting the outputs of the test circuit to a predetermined state coupled to the outputs of the test circuit.

REFERENCES:
patent: 5898700 (1999-04-01), Kim
patent: 5977763 (1999-11-01), Loughmiller et al.
patent: 6349398 (2002-02-01), Resnick
patent: 6570400 (2003-05-01), Habersetzer et al.
patent: 6687865 (2004-02-01), Dervisoglu et al.
patent: 6788087 (2004-09-01), Schnabel
patent: 2002/0087284 (2002-07-01), Mueller
Levy, P. S., “Power-Down Structures for BIST”, IEEE, Mar. 1991, pp. 266-269.

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