Nondestructive inspection method and apparatus

Details Nondestructive inspection method and apparatus Nondestructive inspection method and apparatus

2007-05-08

2007-05-08

Desire, Gregory (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C356S237200, C356S239800, C356S243400, C356S369000, C382S165000, C382S170000

Reexamination Certificate

active

11190220

ABSTRACT:
The present invention relates to a method for inspecting a crack in a metal surface or the like, and, particularly, to an inspection method and apparatus for nondestructive inspection such as liquid penetrant inspection and magnetic particle testing. The present invention provides a flaw inspection method that essentially comprises the steps of illuminating a surface of a sample to be inspected, obtaining an image of the surface, characterizing a potential flaw on the inspected surface by processing the obtained image, displaying an image of the potential flaw, verifying that the potential flaw is a true flaw, and storing an image of the verified flaw in memory.

REFERENCES:
patent: 5835220 (1998-11-01), Kazama et al.
patent: 6434257 (2002-08-01), Mohan et al.
patent: 6618079 (2003-09-01), Higuchi
patent: 6950545 (2005-09-01), Nomoto et al.
patent: 6975391 (2005-12-01), Asano et al.
patent: 2005/0259861 (2005-11-01), Nomoto et al.

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