Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-01-09
2007-01-09
Wu, Jingge (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S199000, C382S224000, C382S262000, C348S092000, C348S125000, C356S073100, C356S239200
Reexamination Certificate
active
10001177
ABSTRACT:
A method is provided for detecting spot defects on an object when an allowable variation (called the “background”) in the appearance of the object can be modeled. Methods are also provided for measuring and classifying detected spot defects. An alignment model is used to align the image of the object, a background model is then used to estimate the (possibly different) background in each region, and each background is substantially removed from the image so as to form a foreground image on which blob analysis can be applied to detect spot defects, the blob analysis using a threshold image that accommodates different noise statistics for each region. The method facilitates robust spot defect inspection of fiber optic end faces, or of any object with different object regions. The method also allows use of blob analysis over a larger range of conditions, including conditions that make simple blob analysis infeasible.
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Evan Lubofsky, Machine vision takes guesswork out of fiber-polishing inspection, Laser Focus World, Sep. 2001.
Akgul Yusuf
Bachelder Ivan
Davis Jason
Koljonen Juha
Morje Prabhav
Cognex Technology and Investment Corporation
Kim Charles
Weinzimmer Russ
Wu Jingge
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