Method for sensing wafers located inside a closed wafer...

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet

Reexamination Certificate

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C250S559330, C250S559360, C250S559460, C356S508000

Reexamination Certificate

active

11343476

ABSTRACT:
Wafers in a cassette are mapped without having to open the cassette. The cassette is at least partially transparent to a particular type of radiation. A source of the radiation is directed into the cassette, through a transparent or translucent part of the cassette, and an imaging sensor sensitive to the radiation detects radiation that is reflected off the wafers inside the cassette. A second source of radiation and a second camera preferably provide additional images of the wafers from a different angle. By processing these images, the spatial orientation of the wafers and loading status of the cassette can be determined.

REFERENCES:
patent: 5504345 (1996-04-01), Bartunek et al.
patent: 5721607 (1998-02-01), Ota
patent: 5933521 (1999-08-01), Pasic
patent: 5995234 (1999-11-01), Nishi
patent: 6013920 (2000-01-01), Gordon et al.
patent: 6053983 (2000-04-01), Saeki et al.
patent: 6069690 (2000-05-01), Xu et al.
patent: 6356091 (2002-03-01), Nimtz et al.
patent: 6452503 (2002-09-01), Weiss
patent: 6636626 (2003-10-01), Yoo et al.
patent: 2003/0199173 (2003-10-01), Ogawa et al.
patent: 2004/0034976 (2004-02-01), Wakizako et al.
patent: 03-023647 (1991-01-01), None

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