Method and apparatus for locating and testing a chip

Details Method and apparatus for locating and testing a chip Method and apparatus for locating and testing a chip

2007-05-15

2007-05-15

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755090, C324S1540PB

Reexamination Certificate

active

10906306

ABSTRACT:
A probe apparatus includes a nest element operable to precisely locate a chip having a plurality of exposed interconnects on a face of the chip to permit conductive connection to the chip through the interconnects. The nest element includes a pocket dimensioned to locate the chip within a tolerance of less than a width of one of the interconnects, and tapered walls extending upwardly and outwardly from the pocket, the tapered walls adapted to guide the chip into the pocket. One or more piezoelectric elements can be attached to or provided within to the nest element to impart vibration to the nest element, causing the chip to be “fluidized” such that the chip is guided into the pocket under the force of gravity or other externally applied force.

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