Electricity: measuring and testing – Determining nonelectric properties by measuring electric... – Semiconductors for nonelectrical property
Reexamination Certificate
2007-01-30
2007-01-30
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Determining nonelectric properties by measuring electric...
Semiconductors for nonelectrical property
C324S1540PB, C324S685000, C324S721000, C324S760020, C327S083000, C327S371000, C327S512000, C374S172000, C374S178000
Reexamination Certificate
active
11085828
ABSTRACT:
Method and system for periodically measuring the junction temperature of a semiconductor device. The junction is excited by at least two sequential predetermined currents of different magnitudes. The voltage response of the junction to the at least two currents is measured and the temperature of the junction is calculated, while substantially canceling ohmic effects, by using the voltage response and a correction factor. Whenever desired, the junction is excited by a set of at least four sequential different currents having known ratios. The voltage response to the set is measured and the correction factor is calculated by using each voltage response to the set.
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Chan Emily Y
National Semiconductor Corporation
Nguyen Vinh
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