Method of RFIC die-package configuration

Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S125000, C257SE21505

Reexamination Certificate

active

10944526

ABSTRACT:
A method for packaging a radio frequency integrated circuit (RFIC) in multiple packages begins by determining a 1stposition of the RFIC die in a 1stpackage wherein the positioning is such to minimize adverse affects of parasitic components of coupling between the radio frequency input/output section and an antenna. Once the position within the 1stpackage has been determined, the corresponding parasitics are measured to determine their values. The processing then continues by determining a 2ndposition of the RFIC die in a 2ndpackage based on the values of the parasitic components. Accordingly, the 2ndposition places the die within the 2ndpackage such that the parasitic components of coupling between the RF I/O section to the antenna within the 2ndpackage substantially matches the parasitic components of coupling the RFIO section to the antenna in the 1stpackage. Accordingly, different packages may be used with the same RFIC die, while maintaining the desired noise reduction.

REFERENCES:
patent: 6580163 (2003-06-01), Poulin
patent: 2001/0026953 (2001-10-01), Ito et al.
patent: 2001/0052645 (2001-12-01), Op'T Eynde et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of RFIC die-package configuration does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of RFIC die-package configuration, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of RFIC die-package configuration will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3754538

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.