Dynamic silicon characterization observability using...

Details Dynamic silicon characterization observability using... Dynamic silicon characterization observability using...

2007-01-16

2007-01-16

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S765010, C324S073100, C703S015000

Reexamination Certificate

active

11055045

ABSTRACT:
A method and system for dynamic characterization observability using functional clocks for system or run-time process characterization. Silicon characterization circuitry may be read after silicon chips have been assembled in a package and installed in a system. A characterization circuit comprising one or more oscillators generates signal pulses, wherein the signal pulses represent a frequency of a circuit in the processor chip. A sampler circuit is connected to the characterization circuit, wherein the sampler circuit counts the number of the signal pulses from the characterization circuit within a predetermined time period. A control unit is connected to the sampler circuit, wherein the control unit comprises macros for collecting count data from the one or more oscillators to determine the silicon characterization. Based on the silicon characterization, the optimal operating frequency of the processor chip may be identified, as well as possible lifetime degradation of circuits on the chip.

REFERENCES:
patent: 5535370 (1996-07-01), Raman et al.
patent: 5568493 (1996-10-01), Morris
U.S. Appl. No. 11/050,324, filed Feb. 3, 2005, Floyd et al.

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