Drain extended MOS transistors with multiple capacitors and...

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S379000

Reexamination Certificate

active

11047245

ABSTRACT:
Multi-capacitor drain extended transistor devices and methods are provided. A first capacitor structure comprises a first dielectric layer (14) and a first gate layer (16) and first and second lateral sides. The first capacitor structure overlies a channel region of a first conductivity type in a semiconductor substrate (4). A second capacitor structure comprising a second dielectric layer (26) and a second gate layer (28) is formed overlying the first gate structure. A source region (22) of a second conductivity type formed in the semiconductor substrate (6) proximate the first lateral side of the gate and a drain extension region/well (12) lightly doped of the second conductivity type is formed in the semiconductor substrate under a portion of the gate structure. A drain region (24) of the second conductivity type formed within the drain extension region (12). The first capacitor structure and the second capacitor structure connect in series to permit a higher operational gate voltage. Other systems and methods are disclosed.

REFERENCES:
patent: 5296393 (1994-03-01), Smayling et al.
patent: 5604369 (1997-02-01), Duvvury et al.
patent: 5729035 (1998-03-01), Anma
patent: 5981335 (1999-11-01), Chi
patent: 6222245 (2001-04-01), Bez et al.
patent: 6300662 (2001-10-01), Doyle et al.
patent: 6445617 (2002-09-01), Sakakibara
patent: 6528842 (2003-03-01), Luich et al.
patent: 6548874 (2003-04-01), Morton et al.
patent: 6620688 (2003-09-01), Woo et al.
patent: 6660603 (2003-12-01), Mitros
patent: 6730960 (2004-05-01), Forbes
patent: 6732335 (2004-05-01), Takabayashi et al.
patent: 6804095 (2004-10-01), Kunz et al.
patent: 2001/0032997 (2001-10-01), Forbes et al.
patent: 2002/0043676 (2002-04-01), Ohtsuka et al.
patent: 2005/0275004 (2005-12-01), Watanabe
patent: 0847091 (1998-06-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Drain extended MOS transistors with multiple capacitors and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Drain extended MOS transistors with multiple capacitors and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Drain extended MOS transistors with multiple capacitors and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3747971

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.