Semiconductor circuit, method of monitoring...

Details Semiconductor circuit, method of monitoring... Semiconductor circuit, method of monitoring...

2007-09-25

2007-09-25

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C714S733000, C714S734000, C368S107000

Reexamination Certificate

active

11019238

ABSTRACT:
A semiconductor circuit is disclosed, including a DLL circuit for supplying a desired signal-delay amount. The DLL circuit includes detecting means for detecting variations of a signal-delay amount, and delay-amount control means for generating a delay-amount control signal for controlling, depending on the variations of the signal-delay amount detected by the detecting means, the signal-delay amount of the DLL circuit. The semiconductor circuit further includes a part for monitoring circuit performance of the semiconductor circuit based on the delay-amount control signal.

REFERENCES:
patent: 5675274 (1997-10-01), Kobayashi et al.
patent: 5920518 (1999-07-01), Harrison et al.
patent: 6437553 (2002-08-01), Maloney et al.
patent: 6476594 (2002-11-01), Roisen
patent: 6486651 (2002-11-01), Lee et al.
patent: 6493829 (2002-12-01), Kubo
patent: 6518807 (2003-02-01), Cho
patent: 6727734 (2004-04-01), Gomm
patent: 6759911 (2004-07-01), Gomm et al.
patent: 6861886 (2005-03-01), Ludden et al.
patent: 6985401 (2006-01-01), Jang et al.
patent: 7075285 (2006-07-01), Chin
patent: 2002/0047742 (2002-04-01), Setogawa
patent: 2002/0180500 (2002-12-01), Okuda et al.
patent: 2003-273728 (2003-09-01), None

Affiliated with

Also associated with

Rating

Semiconductor circuit, method of monitoring... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor circuit, method of monitoring..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor circuit, method of monitoring... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3747680