Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-03-13
2007-03-13
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C374S100000, C711S104000, C711S105000, C711S106000
Reexamination Certificate
active
10973333
ABSTRACT:
A method and system for memory temperature measurement. The method includes the step of monitoring a plurality of accesses to a memory component. A number of accesses occurring to the memory component over a time period is determined. A temperature of the memory component is determined based on the number of accesses occurring over the time period.
REFERENCES:
patent: 6772352 (2004-08-01), Williams et al.
patent: 6832177 (2004-12-01), Khandekar et al.
Reed David G.
Simeral Brad W.
Surgutchik Roman
Titus Joshua
Barlow John
Kundu Sujoy
Nvidia Corporation
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