Vacuum chamber with two-stage longitudinal translation for...

Details Vacuum chamber with two-stage longitudinal translation for... Vacuum chamber with two-stage longitudinal translation for...

2007-04-03

2007-04-03

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

10867164

ABSTRACT:
A circuit board tester that uses a dual-stage translation to bring a unit under test (UUT) into physical and electric contact first with a series of tall probes, then with a series of short probes. Initially, the UUT is mounted on a support plate, and spaced apart from both the tall and short probes. First, in order to perform a functional test on the UUT, a first vacuum stage is engaged, and atmospheric pressure translates the UUT longitudinally until contact is made with a first hard stop, defining a first position. At this first position, the UUT is in contact with a series of tall probes, and is spaced apart from a series of short probes. After a function test is performed, a second vacuum stage is engaged in addition to, and independent of, the first vacuum stage. Atmospheric pressure translates the UUT longitudinally until contact is made with a second hard stop, defining a second position.

REFERENCES:
patent: 6535008 (2003-03-01), Casale
patent: 6771090 (2004-08-01), Harris et al.
Declaration of Neil Adams, (executed Apr. 18, 2006), 2 pages.

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