Nonvolatile memory using a two-step cell verification process

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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C365S185030, C365S185240

Reexamination Certificate

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11141145

ABSTRACT:
A nonvolatile memory comprises a plurality of memory cells, a bit line control circuit and a verifying circuit. The bit line control circuit includes a driving circuit and a non-driving circuit. The verifying circuit verifies a first threshold voltage of the memory cell when the driving circuit drives the memory cell. The verifying circuit also verifies a second threshold voltage when the driving circuit does not drive the memory cell.

REFERENCES:
patent: 5422845 (1995-06-01), Ong
patent: 6507522 (2003-01-01), Lee et al.
patent: 6768680 (2004-07-01), Kato
patent: 6801457 (2004-10-01), Tanzawa et al.
patent: 6894931 (2005-05-01), Yaegashi et al.
patent: 7068542 (2006-06-01), Banks
patent: 7099210 (2006-08-01), Hashiba et al.
IEEE “Transactions on Electron Devices.” vol. 48, No. 9, Sep. 2001, pp. 2032-2042.

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