Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-01-30
2007-01-30
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S1540PB, C349S139000, C438S017000
Reexamination Certificate
active
11195676
ABSTRACT:
The present invention provides a testing method for LCD panels. First, a plurality of panels are formed on a substrate. Each panel has first conducting lines and second conducting lines, which are perpendicular to each other. The first conducting lines and the second conducting lines of adjacent panels are electrically connected, respectively. Finally, all panels on the substrate are simultaneously tested by a testing circuit.
REFERENCES:
patent: 6577367 (2003-06-01), Kim
patent: 6677171 (2004-01-01), Nagata et al.
patent: 6759867 (2004-07-01), Sohn
patent: 6825911 (2004-11-01), Lee et al.
Fan Chia-Yu
Yu Chih-Lung
Chan Emily Y
Chunghwa Picture Tubes Ltd.
Nguyen Vinh
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