Method for calibrating a probe

Details Method for calibrating a probe Method for calibrating a probe

2007-07-24

2007-07-24

Fulton, Christopher W. (Department: 2859)

Geometrical instruments

Gauge

Movable contact probe, per se

Reexamination Certificate

active

11286407

ABSTRACT:
A method measures values on a workpiece (7) using a coordinate measuring apparatus which has a measuring probe head (5) with a deflectable probe pin (6). The coordinate measuring apparatus can carry out a linear or nonlinear projection (transformation) of the deflection signals (s) determined by the measuring probe head (5) into a coordinate system (XM, YM, ZM) of the coordinate measuring apparatus using parameters (A). In order to be able to use the method for any measuring probe, more particularly probes whose probe pins are not moveably guided in the directions of the coordinates, at least a portion of the parameters (Aanti) describes components of the deflection of the probe pin which are located tangentially relative to the surface of the workpiece on the touch point.

REFERENCES:
patent: 4972594 (1990-11-01), Gurny et al.
patent: 5895444 (1999-04-01), Ruck et al.
patent: 6434846 (2002-08-01), McMurtry et al.
patent: 6580964 (2003-06-01), Sutherland et al.
patent: 57127805 (1982-08-01), None
W. Lotze “Multdimensional measuring probe head improves accuracy and functionality of coordinate measuring machines”, Measurement 13 (1994), pp. 91 to 97.

Affiliated with

Also associated with

Rating

Method for calibrating a probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for calibrating a probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for calibrating a probe will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3728195