Substrate crack inspecting method, substrate crack...

Details Substrate crack inspecting method, substrate crack... Substrate crack inspecting method, substrate crack...

2007-03-20

2007-03-20

Williams, Hezron (Department: 2856)

Measuring and testing

Vibration

Resonance, frequency, or amplitude study

C073S012010, C073S865600, C073S571000

Reexamination Certificate

active

10965743

ABSTRACT:
Certain example embodiments of the present invention provide a method for detecting a substrate crack by simple equipment and steps. A substrate crack inspecting method may include the steps of (1) producing a sound by providing vibration to a substrate, (2) determining a power spectrum by capturing the produced sound and carrying out an acoustic analysis for the captured sound, and (3) judging whether or not a substrate crack exists based on a spectral intensity of a predetermined frequency region.

REFERENCES:
patent: 3308650 (1967-03-01), Fitzgerald
patent: 4879905 (1989-11-01), Chen et al.
patent: 4884696 (1989-12-01), Peleg
patent: 5195046 (1993-03-01), Gerardi et al.
patent: 5214960 (1993-06-01), Tsuboi
patent: 5285687 (1994-02-01), Ringel et al.
patent: 5520052 (1996-05-01), Pechersky
patent: 6450036 (2002-09-01), Ashida et al.
patent: 3842061 (1990-06-01), None
patent: 2002166234 (2002-06-01), None
patent: 2002-343989 (2002-11-01), None
patent: 2002-343992 (2002-11-01), None
patent: 01/33182 (2001-05-01), None
patent: 01/39253 (2001-05-01), None
Thierry Debelle, “Making Sound Measurements and Octave Analysis”, Aug. 18-20, 1999, National Instruments NIWeek, pp. 1-20, downloaded from www.natinst.com Jun. 14, 2004.
European Search Report Mailed May 11, 2005 in corresponding EP application No. 040224566.4-2004.
Patent Abstracts of Japan, vol. 2002, No. 10, Oct. 10, 2002 & JP 2002 166234 A (Sharp Corp), Jun. 11, 2002.

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