Semiconductor wafer with information protection function

Details Semiconductor wafer with information protection function Semiconductor wafer with information protection function

2007-07-10

2007-07-10

Crane, Sara (Department: 2811)

Active solid-state devices (e.g., transistors, solid-state diode

Housing or package

Smart card package

C257S922000

Reexamination Certificate

active

10990545

ABSTRACT:
When the scribe region2is cut off, the dicing detector53sends the detection signal A to the changeover circuit51and electrically shuts off the pad50and the inspection objective circuit52, and the fixed potential of the input and output passage54from the changeover circuit51to the inspection objective circuit52is monitored by the detector55. At the same time, the detection objective circuit52is changed into a mode, in which a reception of the command of the inspection mode is refused, by the detection signal A. In the case where an abnormality of the fixed potential of the input and output passage54is grasped, the inspection objective circuit52is changed into the safety mode.

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Samyde, David et al, “On a New Way to Read Data from Memory”, Proceedings of the First International IEEE Security in Storage Workshop (SISW'02), 0-7695-1888-5/03, 2003.

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