Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2006-12-26
2006-12-26
Picard, Leo (Department: 2125)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C700S116000, C700S117000, C702S118000, C438S014000
Reexamination Certificate
active
07155300
ABSTRACT:
An inventive method in an integrated circuit (IC) manufacturing process for using data regarding repair procedures conducted on IC's at probe to determine whether any further repairs will be conducted later in the manufacturing process includes storing the data in association with a fuse ID of each of the IC's. The ID codes of the IC's are automatically read, for example, at an opens/shorts test during the manufacturing process. The data stored in association with the ID codes of the IC's is then accessed, and additional repair procedures the IC's may undergo are selected in accordance with the accessed data. Thus, for example, the accessed data may indicate that an IC is unrepairable, so the IC can proceed directly to a scrap bin without having to be queried to determine whether it is repairable, as is necessary in traditional IC manufacturing processes.
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Abstract from JP 5-74909, in English, comprising a concise explanation of the relevance of JP-74909 as required by 37 CFR § 1.98(a)(3).
Fresnoke, Dean,In-Fab Identification of Silicon Wafers with Clean, Laser Marked Barcodes,Advanced Semicondutor Manufacturing Conference and Workshop, 1994, IEEE/SEMI, pp. 157-160.
Akram Salman
Farnworth Warren M.
Gochnour Derek J.
Hembree David R.
Hess Michael E.
Garland Steven R.
Micro)n Technology, Inc.
Picard Leo
TraskBritt
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