Method of producing silicon-germanium-on-insulator material...

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C117S089000, C117S102000, C117S105000

Reexamination Certificate

active

07141115

ABSTRACT:
A method of fabricating a high-quality relaxed SiGe-on-insulator substrate material is provided in which a prefabricated silicon-on-insulator substrate is first exposed to an unstrained Ge-containing source and then heated (annealed/oxidized) to cause Ge diffusion and thermal mixing of Ge within a single-crystal Si-containing layer of the prefabricated silicon-on-insulator substrate. The unstrained Ge-containing source can comprise a solid Ge-containing source, a gaseous Ge-containing source, or ions of Ge.

REFERENCES:
patent: 6515335 (2003-02-01), Christiansen et al.
patent: 6855436 (2005-02-01), Bedell et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of producing silicon-germanium-on-insulator material... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of producing silicon-germanium-on-insulator material..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of producing silicon-germanium-on-insulator material... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3696616

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.