Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor
Reexamination Certificate
2006-11-28
2006-11-28
Hiteshew, Felisa (Department: 1722)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Forming from vapor or gaseous state
With decomposition of a precursor
C117S089000, C117S102000, C117S105000
Reexamination Certificate
active
07141115
ABSTRACT:
A method of fabricating a high-quality relaxed SiGe-on-insulator substrate material is provided in which a prefabricated silicon-on-insulator substrate is first exposed to an unstrained Ge-containing source and then heated (annealed/oxidized) to cause Ge diffusion and thermal mixing of Ge within a single-crystal Si-containing layer of the prefabricated silicon-on-insulator substrate. The unstrained Ge-containing source can comprise a solid Ge-containing source, a gaseous Ge-containing source, or ions of Ge.
REFERENCES:
patent: 6515335 (2003-02-01), Christiansen et al.
patent: 6855436 (2005-02-01), Bedell et al.
Bedell Stephen W.
Fogel Keith E.
Sadana Devendra K.
Hiteshew Felisa
Scully, Scott, Murphy & Presser,P.C.
Trepp, Esq. Robert M.
LandOfFree
Method of producing silicon-germanium-on-insulator material... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of producing silicon-germanium-on-insulator material..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of producing silicon-germanium-on-insulator material... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3696616