Filter design algorithm for multi-variate optical computing

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined

Reexamination Certificate

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C427S008000, C427S009000, C427S162000, C427S164000, C427S166000, C427S402000, C427S419300, C359S359000, C359S580000, C359S582000, C359S588000, C359S589000, C359S885000

Reexamination Certificate

active

07138156

ABSTRACT:
Within a method of making an optical interference filter, sample spectra and measurements of a predetermined characteristic associated with respective spectra are provided. Upon selection of an initial number of filter layers and a thickness for each layer, a transmission spectrum is determined. Each sample spectrum is applied to a regression formula that relates interaction of light with the transmission spectrum to a regression value. A comparison relationship between the calculated regression values and the sample measurements is defined and optimized, wherein thickness of each layer is an optimization variable.

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