Mask compliance testing using bit error ratio measurements

Details Mask compliance testing using bit error ratio measurements Mask compliance testing using bit error ratio measurements

2006-12-26

2006-12-26

Bayard, Emmanuel (Department: 2611)

Pulse or digital communications

Testing

C375S340000

Reexamination Certificate

active

07154944

ABSTRACT:
Mask compliance of a digital signal from a reference device is determined. Bit error rates for first sampling points for a low mask region are detected. The bit error rates for the first sampling points are averaged to produce an average low mask region error rate. Bit error rates for second sampling points for a high mask region are detected. The bit error rates for the second sampling points are averaged to produce an average high mask region error rate.

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