Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-12-26
2006-12-26
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07155355
ABSTRACT:
An apparatus and method for constraining an amplitude range parameter associated with the acquisition and display of a signal under test (SUT) acquires samples of the SUT that are constrained according to the amplitude range parameter to generate a stream of acquired samples representing a constrained SUT. A controller generates a display signal suitable for use by a display device that includes constrained SUT waveform imagery visually cooperating with amplitude segment delineators. The controller adapts the number of amplitude segment delineators in response to the amplitude range parameter.
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Bui Bryan
Lenihan Thomas F.
Moser Patterson & Sheridan LLP
Pretlow Demetrius R.
Tektronix Inc.
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