Optics: measuring and testing – Angle measuring or angular axial alignment
Patent
1998-10-13
2000-03-07
Hantis, K P
Optics: measuring and testing
Angle measuring or angular axial alignment
G01B 1126
Patent
active
060347635
ABSTRACT:
A high precision alignment apparatus is provided that utilizes a semiconductor laser device, such as a laser diode, to provide a source laser beam. The alignment apparatus permits the division of a pair of beam components from the source laser beam useful for either linear or planar alignment. A centroid measurement between the beam components provides a corrected reference point that accounts for the inherent instability of the source laser beam to yield a high level of alignment accuracy. For linear alignment purposes, the beam components are collinearly directed. In the alternative, for planar alignment purposes, the beam components may be either collinear or directed in opposite directions, and rotated to sweep respective planar regions. The laser alignment apparatus is capable of providing a level of accuracy heretofore achievable only with gas lasers, while maintaining the economical attributes of commercial semiconductor laser diodes.
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Kramer David M.
Slater Dan
Hantis K P
Nearfield Systems Incorporated
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