Method and apparatus for testing terminal connections of semicon

Details Method and apparatus for testing terminal connections of semicon Method and apparatus for testing terminal connections of semicon

1993-09-01

1997-04-15

Voeltz, Emanuel T.

Excavating

371 221, 371 223, G01R 3128

Patent

active

056217412

ABSTRACT:
A method tests connections between terminal of a first semiconductor integrated circuit and terminals of a second semiconductor integrated circuit. These first and second semiconductor integrated circuits are mounted on a printed circuit board. The first semiconductor integrated circuit has a test data generator for generating test data for the terminal connection test, a selector for selecting outputs of the test data generator during the terminal connection test, and a test data output unit for providing the test data from the selector to the outside. The second semiconductor integrated circuit has a test data fetch-hold unit for fetching and holding the test data provided by the first semiconductor integrated circuit. This method is characterized by verifying whether or not an output of the test data fetch-hold unit represents a predetermined value, to thereby test the terminal connections of the first and second semiconductor integrated circuits and the AC characteristics thereof.

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