Highly resilient cantilever spring probe for testing ICs

Details Highly resilient cantilever spring probe for testing ICs Highly resilient cantilever spring probe for testing ICs

2006-06-13

2006-06-13

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010

Reexamination Certificate

active

07061262

ABSTRACT:
A probe has a cantilever arm coupled to a base via an anchor. A surface of the arm facing the base or a surface of the base facing the arm has steps with contact points that contact the base when the arm is depressed. Alternatively, the surface of the arm and/or the surface of the base may be curved.

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