Semiconductor element

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor

Reexamination Certificate

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Details

C257S328000, C257S368000, C257S187000

Reexamination Certificate

active

07126169

ABSTRACT:
The present invention provides a semiconductor element in which the field-effect transistor and the Schottky diode are arranged such that a depletion layer stemming from the Schottky diode is superimposed on a depletion layer stemming from a junction between a second conductivity type semiconductor constituting the field-effect transistor and a drift region (first conductivity type semiconductor) in an off-state. Furthermore, the present invention provides a semiconductor element in which the field-effect transistor and the Schottky diode are arranged so that a second conductivity type semiconductor other than the second conductivity type semiconductor constituting the field-effect transistor is not interposed between the electric field effect transistor and the Schottky diode. According to preferable embodiments of the present invention, the reverse recovery time due to a parasitic diode can be reduced by providing the Schottky diode such that the element area of the semiconductor element is not increased. Moreover, the breakdown voltage in the semiconductor element can be improved.

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