Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-08-15
2006-08-15
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C320S132000, C607S029000
Reexamination Certificate
active
07092830
ABSTRACT:
The present invention is directed to a method for analyzing the tail-end behavior of a lithium cell having a solid cathode. The tail of a longer-term accelerated discharge data (ADD) test is estimated from the tail of two shorter-term ADD tests. This is accomplished by first comparing the discharge tails of shorter-term ADD tests and determining angles or rotation that correspond to Rdc growth, and then trending rotation angles versus time to reach a give DoD. For example, the 18-month and 36-month ADD test tails are used to estimate the ADD test tail of a similarly constructed cell subjected to a longer-term ADD test, for example a 48-month ADD test.
REFERENCES:
patent: 4259639 (1981-03-01), Renirie
patent: 4743855 (1988-05-01), Randin et al.
patent: 4830940 (1989-05-01), Keister et al.
patent: 4964877 (1990-10-01), Keister et al.
patent: 5241275 (1993-08-01), Fang
patent: 5369364 (1994-11-01), Renirie et al.
patent: 5391193 (1995-02-01), Thompson
patent: 5435874 (1995-07-01), Takeuchi et al.
patent: 5527630 (1996-06-01), Nagata et al.
patent: 5571640 (1996-11-01), Takeuchi et al.
patent: 6166524 (2000-12-01), Takeuchi et al.
patent: 6167309 (2000-12-01), Lyden
patent: 6307378 (2001-10-01), Kozlowski
patent: 6639386 (2003-10-01), Shiojima
patent: 6820019 (2004-11-01), Kelly et al.
patent: 6940255 (2005-09-01), Loch
patent: 2004/0039424 (2004-02-01), Merritt et al.
patent: 2004/0051504 (2004-03-01), Syracuse et al.
Gan Hong
Syracuse Kenneth
Takeuchi Esther S.
Waite Noelle
Hoff Marc S.
Scalise Michael F.
Suglo Janet L
Wilson Greatbatch Technologies, Inc.
LandOfFree
Method for estimating long term end-of-life characteristics... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for estimating long term end-of-life characteristics..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for estimating long term end-of-life characteristics... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3659776