Semiconductor integrated circuit device and control method...

Details Semiconductor integrated circuit device and control method... Semiconductor integrated circuit device and control method...

2006-11-14

2006-11-14

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C324S073100, C714S030000

Reexamination Certificate

active

07135882

ABSTRACT:
It is intended to provide a semiconductor integrated circuit device permitting reading of information specific to chips within the mounted chips while restraining the increase in the total number of terminals of the package and enabling the area of circuits required for reading information specific to chips to be made smaller than that according to the prior art, and a control method therefor. The same terminal is used as the external terminal to which the pulse signals are inputted and the external terminal from which the chip-specific information is outputted. Also, the external terminal for inputting/outputting required power supply in the normal operation mode and the external terminal for reading chip-specific information in the information reading mode are used in common. The increase in the number of external terminals can be thereby restrained. Moreover, the counter unit is shared between functional circuits and the comparative decision unit. This can serve to restrain the increase in chip area.

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