Polishing pad having a groove arrangement for reducing...

Abrading – Abrading process – Glass or stone abrading

Reexamination Certificate

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C451S527000, C451S285000

Reexamination Certificate

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07125318

ABSTRACT:
A polishing pad (200) that includes a polishing layer (204) having a polishing region (208) for polishing a wafer (220). The polishing layer includes a set of inflow grooves (232) that extend into the polishing region and a set of outflow grooves (236) that extend out of the polishing region. The inflow and outflow grooves cooperate with one another to enhance the utilization of a polishing slurry during polishing of the wafer.

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patent: 5645469 (1997-07-01), Burke et al.
patent: 5650039 (1997-07-01), Talieh
patent: 5990012 (1999-11-01), Robinson et al.
patent: 6120366 (2000-09-01), Lin et al.
patent: 6241596 (2001-06-01), Osterheld et al.
patent: 6843711 (2005-01-01), Muldowney
patent: 7059949 (2006-06-01), Elmufdi et al.
patent: 2002/0068516 (2002-06-01), Chen et al.
patent: 1 114 697 (2001-07-01), None

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