Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-06-06
2006-06-06
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S761010
Reexamination Certificate
active
07057404
ABSTRACT:
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path between the first and second sides of a substrate and a probe contact electrically connected to the conductive path.
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Andrews Mike
Gleason K. Reed
Lesher Tim
Martin John
Chernoff Vilhauer & McClung & Stenzel
Nguyen Vinh P.
Sharp Laboratories of America Inc.
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