Method and apparatus for the direct characterization of the...

Details Method and apparatus for the direct characterization of the... Method and apparatus for the direct characterization of the...

2006-11-07

2006-11-07

Lee, Hwa (Andrew) (Department: 2877)

Optics: measuring and testing

By light interference

C356S073100

Reexamination Certificate

active

07133135

ABSTRACT:
A method and apparatus for the direct characterization of the phase of an optical signal includes measuring the interference between the optical signal and a sequence of optical pulses and processing the measured interference. The method and apparatus split and combine the optical signal and the sequence of optical pulses in order to measure the real and imaginary part of the interference signal for a least two pulses from the sequence of optical pulses. Processing steps are disclosed to obtain phase information on the optical signal from the measured interference.

REFERENCES:
patent: 5530544 (1996-06-01), Trebino et al.
patent: 6819428 (2004-11-01), Ogawa
patent: 7042629 (2006-05-01), Doerr et al.
Dorrer, et al., “Linear Optical Sampling”, IEEE Photonics Technology Letters, vol. 15, No. 12, Dec. 2003, pp. 1746-1748.

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