Optics: measuring and testing – By light interference
Reexamination Certificate
2006-09-05
2006-09-05
Pham, Chi (Department: 2616)
Optics: measuring and testing
By light interference
C370S210000, C356S484000, C359S246000, C359S278000, C250S250000
Reexamination Certificate
active
07102755
ABSTRACT:
A method determines power of a modulated signal that is applied to a wavelength meter by summing bin values within a designated bin range of a frequency transformed interferogram representing the modulated signal and provided by the wavelength meter. In a first embodiment of the method, the bin range within which the bin values are summed is designated by mapping a series of signal characteristics indicative of the types of the modulated signals applied to the wavelength meter, to a series of bin spans within the frequency transformed interferograms that represent the modulated signals. The method then enables a selection of a signal characteristic from the series of signal characteristics to identify the modulated signal that is applied to the wavelength meter. In response to a selection, the bin values are summed within a bin range that is consistent with the mapping of the series of signal characteristics to the series of bin spans and that is positioned about a center bin of the frequency transformed interferogram. In a second embodiment of the method, the bin range within which bin values are summed is designated automatically based on attributes of the frequency transformed interferogram.
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Christian Hentschel, Joachim Vobis, Loren Stokes, Paul Hernday, Val McOmber, Douglas M. Baney, Wayne V. Sorin, Josef Beller, Christopher M. Miller, Stephen W. Hinch—“Fiber Optic Test And Measurement”, Chapter 4, pp. 131-143; ISBN 0-13-534330-5, Edited by Dennis Derickson; 1998 Prentice-Hall, Inc., Upper Saddle River, New Jersey 07458.
Braun David M
Mesel Misty J
Agilent Technologie,s Inc.
Imperato John L.
Pham Chi
Philpott Justin M
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