Data processing: measuring – calibrating – or testing – Measurement system – Time duration or rate
Reexamination Certificate
2006-06-27
2006-06-27
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Time duration or rate
C702S177000, C702S178000, C702S187000, C717S128000, C714S045000
Reexamination Certificate
active
07069176
ABSTRACT:
An integrated circuit is provided with multiple data processing components associated with respective sources which generate trace data streams. A reference timestamp generator is provided and the trace data streams are annotated such that they are output off-chip together with reference timestamp data. Outputting the reference timestamp data together with the trace data streams enables temporal correlation between points in different trace data streams by trace analysis tools.
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Bradley Daryl Wayne
Swaine Andrew Brookfield
Woodhouse Sheldon James
ARM Limited
Barlow John
Nixon & Vanderhye P.C.
Vo Hien
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